akai smart status 20170129

smartctl.log

smartctl 6.5 2016-05-07 r4318 [FreeBSD 12.0-CURRENT amd64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Apple SD/SM/TS...E/F SSDs
Device Model:     APPLE SSD SM0256G
Serial Number:    S2HLNYAH203128
LU WWN Device Id: 5 002538 900000000
Firmware Version: BXW2SA0Q
User Capacity:    251,000,193,024 bytes [251 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    Solid State Device
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ATA8-ACS T13/1699-D revision 4c
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Sun Jan 29 22:39:25 2017 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:   Unavailable
APM feature is:   Unavailable
Rd look-ahead is: Enabled
Write cache is:   Enabled
ATA Security is:  Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(    0) seconds.
Offline data collection
capabilities: 			 (0x53) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					No Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  10) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  1 Raw_Read_Error_Rate     -O-RC-   200   200   000    -    0
  5 Reallocated_Sector_Ct   PO--CK   100   100   000    -    0
  9 Power_On_Hours          -O--CK   099   099   000    -    1664
 12 Power_Cycle_Count       -O--CK   097   097   000    -    2323
169 Unknown_Attribute       PO--C-   226   226   010    -    2023017677760
173 Wear_Leveling_Count     -O--CK   197   197   100    -    8597078041
174 Host_Reads_MiB          -O---K   099   099   000    -    3041925
175 Host_Writes_MiB         -O---K   099   099   000    -    2488634
192 Power-Off_Retract_Count -O--C-   099   099   000    -    258
194 Temperature_Celsius     -O---K   061   048   000    -    39 (Min/Max 9/52)
197 Current_Pending_Sector  -O---K   100   100   000    -    0
199 UDMA_CRC_Error_Count    -O-RC-   200   200   000    -    0
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

General Purpose Log Directory Version 1
SMART           Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00       GPL,SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      1  Comprehensive SMART error log
0x03       GPL     R/O      1  Ext. Comprehensive SMART error log
0x06           SL  R/O      1  SMART self-test log
0x07       GPL     R/O      1  Extended self-test log
0x09           SL  R/W      1  Selective self-test log
0x10       GPL     R/O      1  SATA NCQ Queued Error log
0x11       GPL     R/O      1  SATA Phy Event Counters log
0x30       GPL,SL  R/O      9  IDENTIFY DEVICE data log
0x80-0x9f  GPL,SL  R/W     16  Host vendor specific log
0xaa       GPL,SL  VS       7  Device vendor specific log
0xab       GPL,SL  VS       1  Device vendor specific log

SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged

SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
  255        0    65535  Read_scanning was never started
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Commands not supported

Device Statistics (GP/SMART Log 0x04) not supported

SATA Phy Event Counters (GP Log 0x11)
ID      Size     Value  Description
0x0001  4            0  Command failed due to ICRC error
0x000a  4            4  Device-to-host register FISes sent due to a COMRESET
0x8fff  14: Invalid entry