hdd-ST320014A-5JZH1NEE-20GB-smartdata

smartctl 6.4 2015-06-04 r4109 [x86_64-linux-4.12.5-gentoo-newton] (local build)
Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Seagate UX
Device Model:     ST320014A
Serial Number:    5JZH1NEE
Firmware Version: 3.07
User Capacity:    20,020,396,032 bytes [20.0 GB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ATA/ATAPI-6 (minor revision not indicated)
Local Time is:    Sat Dec 30 11:04:56 2017 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM level is:     128 (quiet), recommended: 128
APM feature is:   Unavailable
Rd look-ahead is: Enabled
Write cache is:   Enabled
ATA Security is:  Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unavailable

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  420) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					No General Purpose Logging support.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 (  20) minutes.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  1 Raw_Read_Error_Rate     POSR--   096   086   025    -    5659762
  3 Spin_Up_Time            PO----   098   097   000    -    0
  4 Start_Stop_Count        -O--CK   100   100   020    -    0
  5 Reallocated_Sector_Ct   PO--CK   100   100   036    -    0
  7 Seek_Error_Rate         POSR--   086   060   030    -    453133387
  9 Power_On_Hours          -O--CK   088   088   000    -    11031
 10 Spin_Retry_Count        -O--C-   100   100   000    -    0
 12 Power_Cycle_Count       -O--CK   100   100   020    -    166
194 Temperature_Celsius     -O---K   023   050   000    -    23
195 Hardware_ECC_Recovered  -O-RC-   100   253   000    -    0
197 Current_Pending_Sector  -O--C-   100   100   000    -    0
198 Offline_Uncorrectable   ----C-   100   100   000    -    0
199 UDMA_CRC_Error_Count    -OSRCK   200   200   000    -    1
200 Multi_Zone_Error_Rate   ------   100   253   000    -    0
202 Data_Address_Mark_Errs  -O--CK   100   253   000    -    0
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

General Purpose Log Directory not supported

SMART Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00           SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      5  Comprehensive SMART error log
0x06           SL  R/O      1  SMART self-test log
0x09           SL  R/W      1  Selective self-test log
0x80-0x9f      SL  R/W     16  Host vendor specific log
0xa0           SL  VS       1  Device vendor specific log
0xa1           SL  VS      20  Device vendor specific log
0xa2           SL  VS     101  Device vendor specific log
0xa8           SL  VS      20  Device vendor specific log
0xa9           SL  VS       1  Device vendor specific log

SMART Extended Comprehensive Error Log (GP Log 0x03) not supported

SMART Error Log Version: 1
No Errors Logged

SMART Extended Self-test Log (GP Log 0x07) not supported

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Commands not supported

Device Statistics (GP/SMART Log 0x04) not supported

SATA Phy Event Counters (GP Log 0x11) not supported