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Created September 17, 2012 03:12
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smartctl 5.42 2011-10-20 r3458 [x86_64-linux-3.5.3-gentoo] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar 7K3000
Device Model: Hitachi HDS723030ALA640
Serial Number: MK0311YHG67G9A
LU WWN Device Id: 5 000cca 225c2d63c
Firmware Version: MKAOA580
User Capacity: 3,000,592,982,016 bytes [3.00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Sun Sep 16 22:12:19 2012 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (29983) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 133 133 054 Pre-fail Offline - 91
3 Spin_Up_Time 0x0007 155 155 024 Pre-fail Always - 495 (Average 504)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 125
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 138 138 020 Pre-fail Offline - 25
9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 12037
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 125
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 145
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 145
194 Temperature_Celsius 0x0002 187 187 000 Old_age Always - 32 (Min/Max 21/46)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 503
SMART Error Log Version: 1
ATA Error Count: 503 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 503 occurred at disk power-on lifetime: 12031 hours (501 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 77 be c7 0b Error: ICRC, ABRT at LBA = 0x0bc7be77 = 197639799
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 40 38 d0 b0 cc 40 08 3d+01:43:44.372 WRITE FPDMA QUEUED
61 28 30 80 78 cb 40 08 3d+01:43:44.372 WRITE FPDMA QUEUED
61 10 28 68 6c cb 40 08 3d+01:43:44.372 WRITE FPDMA QUEUED
61 20 20 88 be c7 40 08 3d+01:43:44.372 WRITE FPDMA QUEUED
61 10 18 68 be c7 40 08 3d+01:43:44.372 WRITE FPDMA QUEUED
Error 502 occurred at disk power-on lifetime: 11936 hours (497 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 10 e8 5d 83 01 Error: ICRC, ABRT at LBA = 0x01835de8 = 25386472
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 30 00 c8 5d 83 40 08 5d+06:24:07.004 WRITE FPDMA QUEUED
61 10 00 38 42 d4 40 08 5d+06:24:06.186 WRITE FPDMA QUEUED
ea 00 00 00 00 00 a0 08 5d+06:24:01.949 FLUSH CACHE EXT
61 08 00 c0 5d 83 40 08 5d+06:24:01.949 WRITE FPDMA QUEUED
ea 00 00 00 00 00 a0 08 5d+06:24:01.946 FLUSH CACHE EXT
Error 501 occurred at disk power-on lifetime: 11635 hours (484 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 28 40 08 c6 0b Error: ICRC, ABRT at LBA = 0x0bc60840 = 197527616
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 28 08 40 08 c6 40 08 5d+11:36:37.819 WRITE FPDMA QUEUED
61 08 00 28 08 c6 40 08 5d+11:36:37.819 WRITE FPDMA QUEUED
61 08 00 90 a4 a5 40 08 5d+11:36:37.052 WRITE FPDMA QUEUED
61 08 08 f8 ef 6d 40 08 5d+11:36:37.052 WRITE FPDMA QUEUED
61 08 00 80 a1 a5 40 08 5d+11:36:37.051 WRITE FPDMA QUEUED
Error 500 occurred at disk power-on lifetime: 11635 hours (484 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 18 50 08 c6 0b Error: ICRC, ABRT at LBA = 0x0bc60850 = 197527632
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 28 08 40 08 c6 40 08 5d+11:36:37.819 WRITE FPDMA QUEUED
61 08 00 28 08 c6 40 08 5d+11:36:37.819 WRITE FPDMA QUEUED
61 08 00 90 a4 a5 40 08 5d+11:36:37.052 WRITE FPDMA QUEUED
61 08 08 f8 ef 6d 40 08 5d+11:36:37.052 WRITE FPDMA QUEUED
61 08 00 80 a1 a5 40 08 5d+11:36:37.051 WRITE FPDMA QUEUED
Error 499 occurred at disk power-on lifetime: 11566 hours (481 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 08 68 c8 c5 0b Error: ICRC, ABRT at LBA = 0x0bc5c868 = 197511272
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 30 18 a0 c8 c5 40 08 2d+15:10:53.073 WRITE FPDMA QUEUED
61 08 10 68 c8 c5 40 08 2d+15:10:53.073 WRITE FPDMA QUEUED
61 18 08 10 c8 c5 40 08 2d+15:10:53.073 WRITE FPDMA QUEUED
61 08 00 00 c8 c5 40 08 2d+15:10:53.073 WRITE FPDMA QUEUED
ea 00 00 00 00 00 a0 08 2d+15:10:52.806 FLUSH CACHE EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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