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smartctl 6.3 2014-07-26 r3976 [x86_64-linux-4.0.0-0.rc3.git2.1.fc23.x86_64] (local build) | |
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org | |
=== START OF INFORMATION SECTION === | |
Device Model: Samsung SSD 850 PRO 256GB | |
Serial Number: S1SUNSAFA06649M | |
LU WWN Device Id: 5 002538 8a0713409 | |
Firmware Version: EXM01B6Q | |
User Capacity: 256,060,514,304 bytes [256 GB] | |
Sector Size: 512 bytes logical/physical | |
Rotation Rate: Solid State Device | |
Device is: Not in smartctl database [for details use: -P showall] | |
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c | |
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 1.5 Gb/s) | |
Local Time is: Sun Mar 22 10:48:25 2015 MSK | |
SMART support is: Available - device has SMART capability. | |
SMART support is: Enabled | |
AAM feature is: Unavailable | |
APM feature is: Unavailable | |
Rd look-ahead is: Enabled | |
Write cache is: Enabled | |
ATA Security is: Disabled, NOT FROZEN [SEC1] | |
Write SCT (Get) Feature Control Command failed: Read of ATA output registers not implemented [JMicron] | |
Wt Cache Reorder: Unknown (SCT Feature Control command failed) | |
=== START OF READ SMART DATA SECTION === | |
SMART overall-health self-assessment test result: PASSED | |
General SMART Values: | |
Offline data collection status: (0x00) Offline data collection activity | |
was never started. | |
Auto Offline Data Collection: Disabled. | |
Self-test execution status: ( 0) The previous self-test routine completed | |
without error or no self-test has ever | |
been run. | |
Total time to complete Offline | |
data collection: ( 0) seconds. | |
Offline data collection | |
capabilities: (0x53) SMART execute Offline immediate. | |
Auto Offline data collection on/off support. | |
Suspend Offline collection upon new | |
command. | |
No Offline surface scan supported. | |
Self-test supported. | |
No Conveyance Self-test supported. | |
Selective Self-test supported. | |
SMART capabilities: (0x0003) Saves SMART data before entering | |
power-saving mode. | |
Supports SMART auto save timer. | |
Error logging capability: (0x01) Error logging supported. | |
General Purpose Logging supported. | |
Short self-test routine | |
recommended polling time: ( 2) minutes. | |
Extended self-test routine | |
recommended polling time: ( 17) minutes. | |
SCT capabilities: (0x003d) SCT Status supported. | |
SCT Error Recovery Control supported. | |
SCT Feature Control supported. | |
SCT Data Table supported. | |
SMART Attributes Data Structure revision number: 1 | |
Vendor Specific SMART Attributes with Thresholds: | |
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE | |
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 | |
9 Power_On_Hours -O--CK 099 099 000 - 32 | |
12 Power_Cycle_Count -O--CK 099 099 000 - 38 | |
177 Wear_Leveling_Count PO--C- 100 100 000 - 0 | |
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 | |
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 | |
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 | |
183 Runtime_Bad_Block PO--C- 100 100 010 - 0 | |
187 Reported_Uncorrect -O--CK 100 100 000 - 0 | |
190 Airflow_Temperature_Cel -O--CK 071 061 000 - 29 | |
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0 | |
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0 | |
235 Unknown_Attribute -O--C- 099 099 000 - 14 | |
241 Total_LBAs_Written -O--CK 099 099 000 - 58337303 | |
||||||_ K auto-keep | |
|||||__ C event count | |
||||___ R error rate | |
|||____ S speed/performance | |
||_____ O updated online | |
|______ P prefailure warning | |
ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron] | |
Read GP Log Directory failed | |
SMART Log Directory Version 1 [multi-sector log support] | |
Address Access R/W Size Description | |
0x00 SL R/O 1 Log Directory | |
0x01 SL R/O 1 Summary SMART error log | |
0x02 SL R/O 1 Comprehensive SMART error log | |
0x06 SL R/O 1 SMART self-test log | |
0x09 SL R/W 1 Selective self-test log | |
0x30 SL R/O 9 IDENTIFY DEVICE data log | |
0x80-0x9f SL R/W 16 Host vendor specific log | |
0xa1 SL VS 16 Device vendor specific log | |
0xa5 SL VS 16 Device vendor specific log | |
0xce SL VS 16 Device vendor specific log | |
0xe0 SL R/W 1 SCT Command/Status | |
0xe1 SL R/W 1 SCT Data Transfer | |
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported | |
SMART Error Log Version: 1 | |
No Errors Logged | |
SMART Extended Self-test Log (GP Log 0x07) not supported | |
SMART Self-test log structure revision number 1 | |
No self-tests have been logged. [To run self-tests, use: smartctl -t] | |
SMART Selective self-test log data structure revision number 1 | |
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS | |
1 0 0 Not_testing | |
2 0 0 Not_testing | |
3 0 0 Not_testing | |
4 0 0 Not_testing | |
5 0 0 Not_testing | |
Selective self-test flags (0x0): | |
After scanning selected spans, do NOT read-scan remainder of disk. | |
If Selective self-test is pending on power-up, resume after 0 minute delay. | |
SCT Status Version: 3 | |
SCT Version (vendor specific): 1 (0x0001) | |
SCT Support Level: 1 | |
Device State: Active (0) | |
Current Temperature: 29 Celsius | |
Power Cycle Min/Max Temperature: ?/ ? Celsius | |
Lifetime Min/Max Temperature: ?/ ? Celsius | |
Under/Over Temperature Limit Count: 0/186 | |
SCT Temperature History Version: 2 | |
Temperature Sampling Period: 10 minutes | |
Temperature Logging Interval: 10 minutes | |
Min/Max recommended Temperature: ?/ ? Celsius | |
Min/Max Temperature Limit: ?/ ? Celsius | |
Temperature History Size (Index): 128 (0) | |
Index Estimated Time Temperature Celsius | |
1 2015-03-21 13:30 ? - | |
... ..(126 skipped). .. - | |
0 2015-03-22 10:40 ? - | |
Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron] | |
SCT (Get) Error Recovery Control command failed | |
Device Statistics (GP Log 0x04) not supported | |
ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron] | |
Read SATA Phy Event Counters failed | |
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